Engineers can use AI/ML to reduce test development time, analyze test data from manufacturing, automate visual inspection and calibration, and identify counterfeit components. Here’s how some do it. Testing takes too much time; just ask any engineering or production manager. Shortening test-development time can reduce time to market. Shortening production test time lowers manufacturing costs. […]
Synopsys
What is PCIe gen 6 and how do I test it? Part 2
PAM4 modulation boosts throughput but adds test challenges. Part 1 of this two-part series described the evolution of the PCI Express (PCIe) standard, including the move from non-return-to-zero (NRZ) signaling in PCIe 5 to four-level pulse-amplitude modulation (PAM4) signaling in PCIe 6. What unique test challenges does PCIe 6 present? As mentioned in Part 1, […]
