• Skip to primary navigation
  • Skip to main content
  • Skip to primary sidebar
  • Skip to footer
  • Advertise
  • Subscribe

Test & Measurement Tips

Oscilloscopes, electronics engineering industry news, how-to EE articles and electronics resources

  • Oscilloscopes
    • Analog Oscilloscope
    • Digital Oscilloscope
    • Handheld Oscilloscope
    • Mixed-signal Oscilloscope
    • PC-based Oscilloscopes – PCO
  • Design
  • Calibration
  • Meters & Testers
  • Test Equipment
  • Learn
    • eBooks/Tech Tips
    • FAQs
    • EE Training Days
    • Learning Center
    • Tech Toolboxes
    • Webinars & Digital Events
  • Video
    • EE Videos
    • Teardown Videos
  • Resources
    • Design Guide Library
    • Digital Issues
    • Engineering Diversity & Inclusion
    • Leap Awards
    • White Papers
  • Subscribe
You are here: Home / Meters & Testers / Bench Test / T&M upgrades support coherent module, silicon photonics test applications

T&M upgrades support coherent module, silicon photonics test applications

October 7, 2020 By Lee Teschler Leave a Comment

VIAVI has released six major enhancements to the LightDirect family of modules for the MAP-300 test platform, which was introduced last year, with specific focus on supporting coherent module and silicon photonics test applications.

· New high power, C+L band, continuously tunable laser module, the mTLS-C1, the most compact on the market map modulesfor its performance class.

· Six new CW source types added to mSRC-C2 supporting all telecom telemetry wavelengths and critical new O-band additions, with both 1310nm DFB and high-power O-band broadband SLED now supported.

· New variable back reflection module, the mVBR-C1, to support the requirements of the recent OIF specification for 400G-ZR.

· Two new variants of the mPCX-C1, a full O-band version and a high-speed polarization scrambler, for manufacturing applications requiring only simple polarization scrambling.

· Significant feature enhancements to the mVOA-C1 module to support hardware triggers for LOS calibration, millisecond resolution disruption test modes, and new power control modes using external Optical Power Meters (OPMs).

· A new MPO and high-power integrating sphere for the mOPM-C1 along with the first release of OPMScope on MAP-300, converting a chassis of power meters into a powerful multi-channel logging and transient capture system.

VIAVI is releasing three new fiber connectivity manufacturing solutions designed to optimize quality, productivity and capital utilization:

The VIAVI CleanBlastPRO is the next generation in automated connector end-face cleaning systems, offering new features and capabilities to ensure clean end-faces for both single and multi-fiber connectors for the utmost in reliability and repeatability. Using a non-contact cleaning method with the industry’s most trusted and effective solvent, CleanBlastPRO delivers streamlined productivity workflows and a 9X cost saving over traditional contact-based consumable cleaning methods.

New time-saving measurement modes have been added to the MAP-300 Passive Component/ Connector Test (PCT) optical test system. The new VIAVI FastIL mode enables a user to measure the insertion loss (IL) of a 12 fiber MOP in under four seconds, representing a time savings of 20 to 40 percent. New data management utilities seamlessly integrate into the PCT-Control Center application, and greatly simplify the creation of html-based reports.

In addition, the MAP-300 based mSWS Swept Wavelength System integrates a new, modular higher power swept laser, the mSWS-A2SLS. Already the lowest cost of ownership test solution for volume ROADM component manufacturing, the new modular laser enables a 50 percent reduction in rack space, up to 20 percent cycle time improvement and a further 30 percent reduction in the total cost of ownership when leveraging the open platform software interface and distributed architecture, all while maintaining current measurement performance.

Viavi Solutions, 6001 America Center Drive, 6th Floor, San Jose, CA 95002, 408 404 3600, www.viavisolutions.com

You may also like:

  • scope probes
    Working with oscilloscope probes, part two
  • otdr
    Finding fiber-optic cable anomalies
  • OEO
    Understanding and measuring optoelectronic oscillators
  • evolution of 5G
    Testing regimes for the new frequencies and features of 5G
  • antenna array
    Verifying 5G with OTA testing

Filed Under: Bench Test, Communication Test, Test Equipment Tagged With: viavisolutions

Reader Interactions

Leave a Reply Cancel reply

You must be logged in to post a comment.

Primary Sidebar

Featured Contributions

Why engineers need IC ESD and TLP data

Verify, test, and troubleshoot 5G Wi-Fi FWA gateways

How to build and manage a top-notch test team

How to use remote sensing for DC programmable power supplies

The factors of accurate measurements

More Featured Contributions

EE TECH TOOLBOX

“ee
Tech Toolbox: Internet of Things
Explore practical strategies for minimizing attack surfaces, managing memory efficiently, and securing firmware. Download now to ensure your IoT implementations remain secure, efficient, and future-ready.

EE TRAINING CENTER

EE Learning Center

EE ENGINEERING TRAINING DAYS

engineering
“test
EXPAND YOUR KNOWLEDGE AND STAY CONNECTED
Get the latest info on technologies, tools and strategies for EE professionals.
“bills

RSS Current EDABoard.com discussions

  • ISL8117 buck converter blowing up
  • need of carrier supression when locking to cavity resonator
  • Wireless microphone reviews
  • audio transformers impedance
  • Help Creating .lib File for SCR in LTspice

RSS Current Electro-Tech-Online.com Discussions

  • RS485 bus: common ground wire needed or not?
  • Kawai KDP 80 Electronic Piano Dead
  • Good Eats
  • What part is this marked .AC ?
  • Photo interrupter Connections
Search Millions of Parts from Thousands of Suppliers.

Search Now!
design fast globle

Footer

EE World Online Network

  • 5G Technology World
  • EE World Online
  • Engineers Garage
  • Analog IC Tips
  • Battery Power Tips
  • Connector Tips
  • DesignFast
  • EDA Board Forums
  • Electro Tech Online Forums
  • EV Engineering
  • Microcontroller Tips
  • Power Electronic Tips
  • Sensor Tips

Test & Measurement Tips

  • Subscribe to our newsletter
  • Advertise with us
  • Contact us
  • About us

Copyright © 2025 · WTWH Media LLC and its licensors. All rights reserved.
The material on this site may not be reproduced, distributed, transmitted, cached or otherwise used, except with the prior written permission of WTWH Media.

Privacy Policy