IQFlow functions are now part of Tektronix RSA7100A wideband signal analysis instrumentation. This enhancement is said to deliver the speed and flexibility needed to perform real-time digital signal processing (DSP) and support hardware in the loop (HWIL or HIL) test for radar and electronic warfare (EW) systems. The RSA7100A’s real-time analysis for live monitoring of […]
Automotive and Aerospace
Test setups will check DSRC and vehicle-to-everything comm capabilities
Keysight Technologies Inc. will work with IT-Telecom to collaborate on a testing solution for Dedicated Short-Range Communication (DSRC) or Vehicle-to-everything (V2X) communication. IT Telecom is a V2X, Intelligent Transport System (ITS) solutions company in Korea that specializes in DSRC technology. DSRC signaling module and protocol expertise from IT-Telecom enhances system integrity and productivity. Safety is […]
Automotive Ethernet test software covers BroadR-Reach, 100Base-T1 and 1000Base-T1 formats
Keysight Technologies, Inc. today unveiled a total of five new automotive Ethernet solutions at the Automotive Testing Expo 2017, Suburban Collection Showplace, Booth 2008, Novi, Michigan, Oct. 24-26. These solutions help automotive design and test engineers bring their products to market faster with easy-to-use conformance testing. Among the innovations unveiled publicly for the first time is […]
The challenges of HIL testing and ADAS
Engineers running hardware-in-the-loop simulations face difficulties associated with how to devise sensor signals that truly exercise advanced drive assistance systems. DAVID A. HALL, National Instruments Corp. More than 50 years ago, in 1959, the Cadillac Cyclone XP-74 concept car featured two modified aircraft radars designed to alert the driver about oncoming traffic. Today, an automotive […]
Test system components and rack assemblies speed ATE integration
New ATE Core Configurations deliver core mechanical, power and safety infrastructure to help users accelerate the design and build of automated test systems in industries ranging from semiconductor and consumer electronics to aerospace and automotive. Developed by National Instruments Corp., ATE Core Configurations help simplify the design, procurement, assembly, and deployment of smarter test systems […]
Arbitrary waveform generator targets demanding advanced research, radar/EW design tasks
A new arbitrary waveform generator (AWG) is said to offer high signal fidelity and scalability at an affordable price point to meet demanding signal generation needs in advanced research, electronic test, and radar and electronic warfare (EW) system design and test. The new AWG5200 series from Tektronix Inc. offers an impressive set of capabilities not […]
SAKOR Technologies Celebrates 30th anniversary
SAKOR Technologies, Inc. announces that it is celebrating its 30th anniversary in business. The company has grown from a two-person firm writing real time software for other companies’ test systems to an industry leader developing and manufacturing its own control systems and sophisticated testing products. SAKOR products are serving a variety of major markets and […]
Teledyne LeCroy targets connected car development at Detroit auto tech center
Test instrument maker Teledyne LeCroy is opening a new Automotive Technology Center in Farmington Hills, Mich. The company is also creating a special Automotive Solutions Group said to have core competencies aimed at helping companies advance the development and use of a wide range of technologies within the connected car. The Teledyne LeCroy Automotive Solutions […]
High-Speed, High-Res PXIe Digitizers feature
Fast Data Transfers
Spectrum Instrumentation has released its first high-speed digitizer product line based on the popular PXIe (PXI Express) modular instrumentation standard. The M4x.44xx series consists of six new products each packaged in a dual-width 3U module and incorporating a four lane PCI Express Generation 2 interface. The high-performance interface allows data transfer speeds in excess of […]
Dummies from NASA instrumented
with data acquisition systems
Engineers at NASA’s Langley Research Center in Hampton, Va., will conduct nine water-impact drop tests to evaluate the safety of the splash down when the Orion spacecraft returns from deep-space missions and touches down on Earth. Onboard will be two test dummies wired up to Diversified Technical Systems (DTS) data acquisition systems. The DAS data […]
