Industrial measurements often must take place via specialized transducers sized specifically for the current and voltage swings involved. Will Delsman | NK Technologies Older ammeters worked great when the current flowed at a steady 50 or 60 Hz. Consider the antique GE model 8AK1A1AF. I have one that remains accurate after decades of use and […]
Instrumentation
Multifunction test instruments connect to PCs via USB/Wi-Fi
Digilent Inc.’s OpenScope: Open-source PICMZ All-in-One Instrumentation Device is available for immediate shipment worldwide from Digi-Key Electronics, a global electronic components distributor, the companies announced today. The OpenScope MZ is a portable multi-function programmable instrumentation module. What does that mean? It is a device that connects to a computer (through Wi-Fi or a USB cable) that allows […]
New preform quality control instrument
For measuring the transmission value of preforms, Colour Consult introduces the new P1 desktop instrument for quality control. The instrument measures how much light passes through a preform or plastic cap. From transparent (100% transmission) to very dark, almost opaque preforms (0,1%). Small changes in transmission values are detected in an early stage minimizing waste […]
High-Speed, High-Res PXIe Digitizers feature
Fast Data Transfers
Spectrum Instrumentation has released its first high-speed digitizer product line based on the popular PXIe (PXI Express) modular instrumentation standard. The M4x.44xx series consists of six new products each packaged in a dual-width 3U module and incorporating a four lane PCI Express Generation 2 interface. The high-performance interface allows data transfer speeds in excess of […]
Hexagon Manufacturing Intelligence upgrades
scanning sensor offering for CMM tactile scanning
Hexagon Manufacturing Intelligence announced it has released its new HP-S-X1 series of compact probes for 3D coordinate measuring machine (CMM) tactile scanning. The HP-S-X1 product line features a new bearing system for better joint repeatability and accepts longer horizontal styli for improved flexibility. Operators do not need to change modules to tackle different measurement tasks, […]
New functionality has been added to its SENMATION universal sensor interface
Hexagon Manufacturing Intelligence has announced new functionality has been added to its SENMATION universal sensor interface for Leitz PMM-C coordinate measuring machines (CMMs). SENMATION deploys the right sensor at the right time on a single CMM to address complex measurement challenges found in industries such as automotive, oil and gas, and energy. The new sensor […]
SPECTRO reaches milestone with shipment of 40,000th instrument
SPECTRO Analytical Instruments, a manufacturer of advanced instruments for elemental analysis, has announced a major milestone — the shipment of its 40,000th spectrometer. The “milestone instrument,” a SPECTRO ARCOS state-of-the-art optical emission spectrometer with inductively coupled plasma (ICP-OES), was delivered to SGS Germany GmbH. The SGS-Group is a worldwide leader in the fields of testing, […]
Tektronix first wireless lab management solution for education
Tektronix, Inc., a manufacturer of oscilloscopes, announced the industry’s first wireless lab instrument management solution for quickly setting up and efficiently managing basic electronics engineering laboratories at colleges and universities. The new TekSmartLab™ TSL3000A solution supports up to 120 instruments (30 test benches) on a single platform. At many learning institutions, implementing productive and fully […]
Parametric curve tracer simplifies high-voltage C-V tests
For test engineers responsible for configuring high power semiconductor test systems, the new Keithley Model 8020 High Power Interface Panel improves connectivity and simplifies complex measurements like high voltage capacitance-voltage (C-V) measurements. The Model 8020 reduces set-up times, minimizes opportunities for connection errors, improves operator and test hardware protection, and increases users’ confidence in the […]
Galil DMC-4020 moves unique instrument for leaf analysis
Custom Lab Software Systems Inc., a developer of precision instrumentation, used a Galil DMC-4020 to build the Micron Level 3-D Confocal Profiling and Thickness Measurement System. This is an instrument for optical measurement requested by Dr. Dan Chitwood, Assistant Member at Donald Danforth Plant Science Center. Chitwood is currently researching how to engineer crops to […]
