Rohde & Schwarz bumps up the frequency with the FSPN50 phase noise analyzer and VCO tester.
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5G RF, radio tester cuts bench and production floor footprint
Rohde & Schwarz has developed two additions for its R&S TS8980 family: the R&S TS8980S-4A and the RS TS8980FTA-3A.
What is phase noise and how can I measure it? part 2
Phase noise requires more than one instrument unless you use a phase-noise analyzer.
AOC 2023: Exhibits show the latest in military wireless
Washington — The Association of Old Crows (AOC) held its 60th annual convention in Washington during the week of December 11, 2023. EE World was there on December 12. Here is some of what we saw in the exhibit hall. AOC is a defense-oriented conference that focuses on military wireless communications. In addition to product […]
R&S enters eight-channel oscilloscope game
The Rohde & Schwarz MXO 5 series of eight-channel and four-channel oscilloscopes feature fast capture and low-level triggering so you can see signal details.
IMS 2023 roundup: test equipment
Test equipment plays a major role in product development and production, which was apparent at IMS 2023. In the photos and videos below, you’ll get a taste of test developments at RF, mmWave, and sub-THz frequencies. This year, D-band (110 GHz to 170 GHz) seized a larger portion of the exhibit hall than in past […]
What is jitter and what can I do about it (part 1 of 2)?
Measuring and quantifying jitter are the first steps toward controlling it. Jitter is a measure of the timing performance of a digital data stream such as Ethernet, USB, PCIe, or HDMI. It defines when data transitions occur in relation to an ideal waveform. Excess jitter can lead to signal-integrity problems that result in high bit-error […]
How to make fast and accurate power-integrity measurements
Today’s electronic devices with fast FPGAs, ASICs, and other ICs rely on ever-smaller power rail voltages with tight tolerances. Engineers who incorporate these ICs into their systems need to use oscilloscopes, probes, and measurement techniques that align with today’s tight voltage rail tolerances. Making an accurate ripple measurement with an oscilloscope on a 1 V […]
EE World’s 2023 communications handbook is here
Our 2023 5G, Wired, & Wireless Handbook is now available in ebook form. Download your copy today. It started on a cold January day with an editorial call. A month later, the abstracts came in. After another month, the manuscripts came in. Then came the editing and some back-and-forth with the authors. Next, it was…
What is de-embedding and how do I perform it (part 2)?
When testing a device in a fixture, you can use transfer scattering parameters (T-parameters) to help remove the fixture’s contribution from your measurement result.
