Part 3 of a series on using near-field probes for detecting EMI sources shows you how to set up a spectrum analyzer and how to detect emissions problems. Now that we’ve discussed the theory of measuring near-field emissions (Part 1) and how to use near-field probes (Part 2) to make the measurements let’s discuss how to […]
How to locate EMI emissions with near-field probes: Part 2
Now that you know a little theory of near-field measurements, how do you use near-field probes and a spectrum analyzer to help you troubleshoot and mitigate emissions issues? Remember, as mentioned in Part 1, that deciding whether to use an H-field or E-field probe depends on whether you’ll be probing high switching currents — di/dt […]
How to locate EMI emissions with near-field probes: Part 1
Near-field probes let you find the sources of near-field and far-field EMI that ruin your design, and your day. You don’t need to know Maxwell’s Equations to troubleshoot your designs.
IEEE EMC Symposium 2023: Exhibits
The IEEE Symposium on EMC and SI/PI is growing back to normal size, which is quite a relief after the COVID experience. Part 1 of this series described highlights from the various presentations. One of the highlights during the Symposium on EMC and SI/PI this year in Grand Rapids is always catching up on new […]
IEEE EMC Symposium 2023: Presentations
Long known for its academic papers and presentations, the EMC+SIPI Symposium in 2023 featured more practical tutorials and workshops than ever before. See photos from the technical sessions and workshops.
