Rohde & Schwarz is running an extended promotion to June 30, 2020 that includes 10 value bench instrument solutions. Rohde & Schwarz’s “This Changed Everything” promotion continues to support customers’ long-term viability and eliminate the add-as-you-go component, presenting the opportunity to purchase all the bandwidth, channels, inputs, memory interfaces and signal generation design engineers may […]
Test setup handles next-generation DDR5 memory
The world’s first design and test workflow solution designed to reduce product development time for Double-Data Rate Dynamic Random-Access Memory (DDR5 DRAM) systems has been developed by Keysight Technologies. Running at twice the data rate of DDR4, DDR5 DRAM shrinks design margins and makes it difficult for a hardware designer to optimize the printed circuit […]
Programmable dc loads feature high-speed pulse and transient loading
The DL Series of Digital, Programmable dc Loads, are designed to support the testing requirements for the latest generation of off-line power supplies, dc-dc converters and LED drivers. The DL Series is also equipped to handle a wide range of battery testing requirements. The devices are offered in three power ratings (125 W, 250 W […]
Branch feeder monitors get digital fault monitoring upgrade
A Digital Fault Recording (DFR) feature is now among the capabilities of the Model BFM-II Second-Generation Branch Feeder Monitor. Designed specifically for electrical distribution substation applications, the DFR functionality provides substation engineers with critical information regarding relay tripping and reclosure operations, power disturbances and other system anomalies. The BFM-ll’s unique design allows it to easily […]
Basics of flat screens in test equipment
Flat-screen technology has become ubiquitous. It has almost completely replaced CRTs in test instruments as well as in other appliances. Unfortunately, flat-screen tech can be a bit confusing because of vendors that use their own trade names to refer to their specific type of flat display technology. Here, we’ll try to clear up some of […]
IC testers handle Arm eMRAM compiler IP on Samsung 28-nm FDSOI process technology
A new IC test solution is optimized for the eMRAM (embedded Magnetoresistive Random Access Memory) compiler IP from Arm, built on Samsung Foundry’s 28-nm FDSOI process technology. The new eMRAM test solution is the result of a collaboration between Mentor and Arm. Mentor also has a long track record of working closely with Samsung on […]
Hand-held spectrum analyzer app streamlines in-building signal mapping
A hand-held spectrum analyzer series (Spectrum Compact) coupled with NEON Signal Mapper software delivers real-time geo-referenced signal data that can be visualized both locally by the user and remotely on a 3D display. This new in-building signal testing solution leverages the Spectrum Compact’s exceptional measurement accuracy and industry-leading noise floor (-128 dB) to provide a […]
Source measurement unit software simulates classic curve tracer functions
Keithley I-V Tracer software brings many of the features loved in classic curve tracers to Keithley SourceMeter Source Measure Units (SMU). Because an SMU can source voltage or current while measuring voltage and current, it has similar hardware qualities to a curve tracer. The new software leverages the touchscreen interface of 2400 Series Graphical SMUs […]
HDMI 2.1 8K video generator/analyzer includes enhanced game-testing features
An HDMI 2.1 Pattern Generator and Analyzer with enhanced gaming features, dubbed the UCD-422, is an HDMI 2.1-capable 8K device supporting Dolby Vision testing and other HDR formats. The UCD-422 is now available for order. The UCD-422 supports FRL and TMDS modes and can test video up to 8K at 60 fps. Support for HDCP […]
Chamber handles far-field radar tests
The R&S ATS1500C antenna test system is a test chamber for high-performance radar testing, offering an outstanding indirect far-field testing performance. The test system consists of the new, compact R&S ATS1500C automotive radar test chamber for far-field testing, in combination with the R&S AREG100A automotive radar echo generator for precise radar target simulation at various […]
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