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basics

Quantifying signal compression

September 25, 2017 By David Herres 1 Comment

signal compression

The object of signal compression is to facilitate transmission, reception, processing, and the use of great amounts of data while conserving valuable storage space and transmission resources. Data compression is obviously a good approach provided that it doesn’t incur an unacceptable amount of information loss. It was once widely assumed that detail or information, once […]

Filed Under: Featured, New Articles, oscilloscope measurements Tagged With: basics, FAQ, Tektronix

Negative resistance: meaning and measurement

September 22, 2017 By David Herres 1 Comment

It is a fact, verified in theory and by experiment, that no material can conduct electric current with greater efficiency than an ideal conductor having zero resistance. How, then, can the term “negative resistance” have meaning in the real world? First, it is possible to get negative resistance readings on a DVM. If this happens, they […]

Filed Under: FAQ, Featured, oscilloscope measurements Tagged With: basics, FAQ

Measuring with spectrum analyzers

September 15, 2017 By David Herres Leave a Comment

spectrum analyzers

Modern bench-type and even hand-held oscilloscopes have spectrum analysis capability, providing great added versatility. They can view in rapid succession (or even simultaneously in split-screen format in a mixed-domain instrument) time domain and frequency domain displays of the same signal. Fourier theory tells us that any signal or function in the time domain can be […]

Filed Under: FAQ, spectrum analyzer Tagged With: basics, FAQ, Tektronix

Basics of measuring antenna properties

September 8, 2017 By David Herres 5 Comments

antenna properties

An antenna is simply a conductor or conductor array, usually metal. But how it is situated and terminated that determines its behavior in transmitting and/or receiving electromagnetic radiation. Let’s start with an antenna that is configured to transmit. An oscillating voltage applied at a terminal will cause current to flow through the antenna. A transmitting […]

Filed Under: FAQ, New Articles, wireless test equipment Tagged With: basics, FAQ, Tektronix

Cathode ray tube testing using an oscilloscope

August 28, 2017 By David Herres Leave a Comment

cathode ray tube

The cathode ray tube (CRT) is what made possible TVs, computer monitors, and oscilloscopes as we know them. CRTs have largely been replaced by flat-screen technologies but CRTs still serve in niche applications. For example, some kinds of military needs still require a CRT display. General-purpose CRTs are no longer manufactured in the U.S., but […]

Filed Under: Analog Oscilloscope, FAQ, New Articles Tagged With: basics, FAQ, thomaselectronics

Measuring oscillator jitter

August 23, 2017 By David Herres Leave a Comment

oscillator jitter

In digital electronics, jitter is a particularly insidious form of noise, to be understood, measured and where possible mitigated. Jitter is short-term, generally considered less that one second, deviation from the design intent. It consists of timing fluctuation in periods or transitions within cycles. An eye diagram tells the whole story. While vertical closing of […]

Filed Under: New Articles, Test Equipment Tagged With: basics, FAQ, Tektronix

Measuring active and passive filters

August 18, 2017 By David Herres 1 Comment

filters

The usual rationale for a filter in electronic circuitry is to reject unwanted portions of a spectrum or at least reduce their amplitudes to acceptable levels without attenuating the desired frequency or range of frequencies. In some situations, active filters are needed to perform this function, and often they are less expensive than alternate solutions […]

Filed Under: FAQ, New Articles, oscilloscope measurements Tagged With: basics, FAQ

Measuring Ebers-Moll model parameters in transistors

August 10, 2017 By David Herres Leave a Comment

measuring transistors

If transistor circuits are to be of any use or amenable to diagnostic procedures, we must be able to model them. Even the best electronic test equipment is useless if we don’t know what to look for in the circuits under investigation. Transistors characteristically have multiple modes of conduction. We can view these phenomena in […]

Filed Under: FAQ, New Articles, Test Equipment Tagged With: basics, FAQ

Measuring emitter followers and other transistor configurations

August 2, 2017 By David Herres 3 Comments

emitter followers

There are three bipolar junction transistor amplifier topologies: common emitter, common base and common collector. (For field-effect transistors, the analogous circuit configurations are common source, common gate and common drain. In the old world of vacuum tubes, they were common cathode, common grid and common plate.) This particular classification derives from the external circuit configuration. […]

Filed Under: FAQ, New Articles, oscilloscope measurements Tagged With: basics, FAQ

Thevenin and Norton help interpret measurement results

July 25, 2017 By David Herres Leave a Comment

Thévenin

Engineers are often tasked with making sense of what initially looks like a tangle of wires, electrical energy sources, and components. Before attacking such situations with scope probes, it’s good to recall a few basics. Thévenin’s Theorem states it is possible to simplify any linear circuit to a single equivalent circuit composed of a single […]

Filed Under: FAQ, Test Equipment Tagged With: basics, FAQ

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