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FAQ

Controlling EMI and improving sustainability

December 10, 2024 By Jeff Shepard Leave a Comment

Optimized designs require less electromagnetic interference (EMI) shielding and other materials, improving sustainability. Improved EMI performance extends system life and reduces e-waste, further enhancing sustainability. More sustainable shielding materials are being developed for use when shielding is required. This article reviews the basics of EMI, examines common shielding materials to provide a baseline for comparing […]

Filed Under: EMI/EMC/RFI, FAQ, Featured Tagged With: FAQ

Engineers use AI/ML to improve test

December 3, 2024 By Martin Rowe Leave a Comment

AI/ML used to test circuits

Engineers can use AI/ML to reduce test development time, analyze test data from manufacturing, automate visual inspection and calibration, and identify counterfeit components. Here’s how some do it. Testing takes too much time; just ask any engineering or production manager. Shortening test-development time can reduce time to market. Shortening production test time lowers manufacturing costs. […]

Filed Under: AI Engineering Collective, FAQ, Featured, Machine Vision/Inspection, Meters & Testers, Test software programming, Video Tagged With: Advantest, flukecalibration, Synopsys, teradyne, testeract, Virinco

How to determine noise figure: part 4

December 2, 2024 By Rick Nelson Leave a Comment

Two incompatible definitions of noise factor can lead to confusion, which you can alleviate by understanding where the differences lie.

Filed Under: FAQ, Featured, spectrum analyzer, vector network analyzer, vector network analyzers Tagged With: anritsu, coppermountaintechnologies, FAQ, keysighttechnologies, rohdeschwarz, Tektronix

How to determine noise figure: part 3

November 21, 2024 By Rick Nelson Leave a Comment

Noise factor and noise figure as defined in an IEEE standard can be derived from a two-port device’s equivalent noise temperature. In part 1 and part 2 of this series we discussed several ways to indicate the noise performance of a device under test (DUT). We first introduced the concept of noise factor based on […]

Filed Under: arbitrary waveform generators, FAQ, Featured, vector network analyzer, vector network analyzers Tagged With: FAQ

How to determine noise figure: part 2

November 13, 2024 By Rick Nelson Leave a Comment

The relationship between noise and temperature prompted a precursor of the IEEE to promulgate an alternative definition of noise figure in 1959. In part 1 of this series, we described the work of the Danish-American radio engineer Harald Friis, who described noise factor F of a device or system as the ratio of the input-power […]

Filed Under: FAQ, Featured, power sensing, vector network analyzer, vector network analyzers Tagged With: FAQ

What information does an eye diagram depict?

November 6, 2024 By Rakesh Kumar Leave a Comment

An eye diagram is a powerful visualization tool in digital communications and high-speed electronics to assess signal quality and channel performance. This FAQ will briefly explain an eye diagram and the overall and specific metrics engineers should know to understand an eye diagram. When capturing signals from a digital bitstream such as Ethernet or USB, […]

Filed Under: FAQ, Featured Tagged With: FAQ

How to determine noise figure: part 1

October 28, 2024 By Rick Nelson Leave a Comment

A noise figure consolidates the effects of various noise types to provide a single specification for the noise performance of a component or system. In electronic circuits and systems, noise is an undesirable, inevitable disturbance in currents and voltages. Noise has many underlying fundamental causes. Thermal noise, also known as Johnson–Nyquist noise, results from random […]

Filed Under: FAQ, Featured Tagged With: FAQ

How to interpret a QAM display: part 3

October 9, 2024 By Rick Nelson Leave a Comment

Error vector magnitude characterizes actual QAM signals’ deviations from their ideal locations due to nonlinearity and phase noise. In part 1 of this series, we discussed quadrature amplitude modulation (QAM), which results from summing orthogonal amplitude-modulated cosine and sine waves of the same frequency. In part 2, we looked at assigning bit sequences to QAM […]

Filed Under: FAQ, Featured Tagged With: FAQ

How to interpret a QAM display: part 2

October 1, 2024 By Rick Nelson Leave a Comment

Sixteen unique 16-QAM symbols can each convey a unique 4-bit sequence. In part 1 of this series, we discussed quadrature amplitude modulation (QAM), which results from summing amplitude-modulated cosine and sine waves of the same frequency. We also looked at the constellation diagram, which a test instrument such as an oscilloscope or vector signal analyzer […]

Filed Under: FAQ, Featured Tagged With: FAQ

How to interpret a QAM display: part 1

September 10, 2024 By Rick Nelson Leave a Comment

A constellation diagram plots a quadrature amplitude modulation (QAM) signal’s in-phase and quadrature components. The EE World article “Should I use a spectrum, signal, or vector network analyzer?” in part 3 mentioned that vector-signal analyzers (VSAs) can display modulation-domain and frequency-domain information. Other instruments incorporating digital signal processing (DSP) capabilities, including oscilloscopes, can provide insights into […]

Filed Under: Analyzer, FAQ, Featured, vector network analyzer, vector network analyzers, wireless Tagged With: FAQ

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