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FAQ

Make the most of oscilloscope triggering: part 2

January 14, 2025 By Martin Rowe Leave a Comment

Advanced triggering techniques can help you track down elusive problems. In part 1 of this series, we investigated the fundamentals of the oscilloscope trigger function, including the simple edge trigger that originated with analog oscilloscopes. In this part, we look at additional triggers that help with troubleshooting. What are some other types of triggering? Advanced […]

Filed Under: Digital Oscilloscope, FAQ, Featured, Mixed-signal Oscilloscope, oscilloscope measurements, Oscilloscopes Tagged With: digital oscilloscope, picotechnology

What are the three levels of TEMPEST testing?

January 8, 2025 By Jeff Shepard Leave a Comment

Telecommunications electronics materials protected from emanating spurious transmissions (TEMPEST) testing, also called emission security (EMSEC) by the National Security Agency (NSA), is an NSA specification and is defined in the NATO SDIP-27 standard. TEMPEST is designed to deny unauthorized access to information derived from intercepting and analyzing unintended electrical signals, sounds, and vibrations emanating from […]

Filed Under: FAQ, Featured

Review: Tekbox TBCG4 harmonic comb generator

January 2, 2025 By Kenneth Wyatt Leave a Comment

Tekbox TBCG4 harmonic comb generator

The Tekbox TBCG4 harmonic comb generator produces a wide range of known frequencies for EMC immunity testing and routine checking of EMC chambers. I’ve used harmonic comb generators for decades in various applications, including antenna measurements, cable resonance measurements, and shielding-effectiveness testing. I also find them useful for checking the daily consistency of test chambers […]

Filed Under: arbitrary waveform generators, Digital Oscilloscope, EMI/EMC/RFI, FAQ, Featured, PC-based spectrum analyzers, Tryouts and Reviews Tagged With: rohdeschwarz, Siglent, tekbox

Free and low-cost online EE tools aid in design

December 23, 2024 By Kenneth Wyatt 2 Comments

Qucs schematic circuit

Downloadable and online free and low-cost EE tools help engineers design and analyze circuits.

Filed Under: Design, EMI/EMC/RFI, FAQ, Featured, spectrum analyzer Tagged With: analogdevices, keysighttechnologies, rohdeschwarz, WurthElectronik

How to calculate and apply an inverse FFT: part 2

December 17, 2024 By Rick Nelson Leave a Comment

time and frequency

In part 1 of this series, we looked at the formula for the inverse discrete Fourier transform and manually calculated the inverse transform for a four-point dataset. Then, we used Excel’s implementation of the inverse fast Fourier transform (IFFT) to verify our work. Could we try something more realistic? Sure. We can take a signal […]

Filed Under: Analyzer, FAQ, Featured, oscilloscope measurements, spectrum analyzer Tagged With: FAQ

How to calculate and apply an inverse FFT: part 1

December 12, 2024 By Rick Nelson Leave a Comment

The inverse Fourier transform (inverse FFT or iFFT) reverses the operation of the Fourier transform and derives a time-domain representation from a frequency-domain dataset. In early 2024, EE World published a series on the Fourier transform, which can convert a time-domain signal to the frequency domain (Figure 1, red arrow). The process is reversible (Figure […]

Filed Under: Communication Test, Digital Oscilloscope, FAQ, Featured, PC-based spectrum analyzers, spectrum analyzer Tagged With: FAQ

How can EMI be weaponized?

December 11, 2024 By Jeff Shepard Leave a Comment

Electromagnetic interference (EMI) can be an unwanted and disruptive aspect of electronic system designs. It can also be amplified and weaponized. EMI is being weaponized in purpose-built high-power microwave (HPM) tactical systems that devastate electronics without the side effects of physical destruction. The initial weapons have been deployed, and a roadmap has been outlined for […]

Filed Under: EMI/EMC/RFI, FAQ, Featured Tagged With: FAQ

Controlling EMI and improving sustainability

December 10, 2024 By Jeff Shepard Leave a Comment

Optimized designs require less electromagnetic interference (EMI) shielding and other materials, improving sustainability. Improved EMI performance extends system life and reduces e-waste, further enhancing sustainability. More sustainable shielding materials are being developed for use when shielding is required. This article reviews the basics of EMI, examines common shielding materials to provide a baseline for comparing […]

Filed Under: EMI/EMC/RFI, FAQ, Featured Tagged With: FAQ

Engineers use AI/ML to improve test

December 3, 2024 By Martin Rowe Leave a Comment

AI/ML used to test circuits

Engineers can use AI/ML to reduce test development time, analyze test data from manufacturing, automate visual inspection and calibration, and identify counterfeit components. Here’s how some do it. Testing takes too much time; just ask any engineering or production manager. Shortening test-development time can reduce time to market. Shortening production test time lowers manufacturing costs. […]

Filed Under: AI Engineering Collective, FAQ, Featured, Machine Vision/Inspection, Meters & Testers, Test software programming, Video Tagged With: Advantest, flukecalibration, Synopsys, teradyne, testeract, Virinco

How to determine noise figure: part 4

December 2, 2024 By Rick Nelson Leave a Comment

Two incompatible definitions of noise factor can lead to confusion, which you can alleviate by understanding where the differences lie.

Filed Under: FAQ, Featured, spectrum analyzer, vector network analyzer, vector network analyzers Tagged With: anritsu, coppermountaintechnologies, FAQ, keysighttechnologies, rohdeschwarz, Tektronix

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